Predictive test strategy for CMOS RF mixers |
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Authors: | E. Garcia-Moreno [Author Vitae] K. Suenaga [Author Vitae]Author Vitae] S. Bota [Author Vitae]Author Vitae] E. Isern [Author Vitae] |
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Affiliation: | Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain |
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Abstract: | In this paper, we present two built-in self-test strategies for the down-converter stage in a GSM receiver. These strategies are based on the prediction of its performance parameters from measurements in test mode. By reusing some receiver blocks as part of the test set-up, the circuitry overhead is kept small. The first strategy uses the local oscillator (LO) signal as the only test stimuli. The second strategy uses additional test circuitry, a generator, and an auxiliary mixer. Prediction accuracies are similar in both strategies, but the test observables in the second one are easier to be obtained. |
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Keywords: | CMOS RF mixers RF test Predictive test |
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