存储测试技术

本文提出一个新的概念——存储测试技术,它特指把整个测试系统包括传感器、适配电路、瞬态波形记录仪、电源等微缩到一个小体积(例如10cm~3),直接放入被测体内、被测环境中进行测试,不需从外部引线.采用存储测试技术使许多复杂的测试过程得以简化,得以实现.存储测试技术的关键是测试装置的微型化和低功耗.本文介绍了存储测试技术的国内外现状是以及目前探索研究的问题与发展.

STORAGE MEASUREMENT TECHNIQUE

This paper raises a new concept of storage measurement technique. It means specially that the whole measurement system,including sensors,conditioning circuits,transient waveform recorder,power supply,etc.,is microminiaturised in a small volume (e.g.10cm~3). therefore measurements can be made at real environments by putting the device directly in the measured object space without any outer cable.Using the storage measurement technique,many complicated measuring processes can be simplified and some difficult to be per- formed ones can be performed.The keys of storage measurmertt tech- nique are microminiaturization and low power consumption.This paper described an up-to-date overview on storage measurement tech- nique both at home and abroad,currently researched topics and their developments.