Novel stationary-sample atomic force microscope with beam-tracking lens

An atomic force microscope with a stationary sample and a scanning cantilever using an optical lever method is demonstrated for the first time. The cantilever tip is translated to measure surface profiles while a simple lens attached to the cantilever holder guides a focused beam from a fixed collimated diode laser. The imaging capability is demonstrated up to 100*100 mu m/sup 2/.<>