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Te concentration dependent photoemission and inverse-photoemission study of FeSe1?xTex
Authors:Takayoshi Yokoya  Rikiya Yoshida  Yuki Utsumi  Koji Tsubota  Hiroyuki Okazaki  Takanori Wakita  Yoshikazu Mizuguchi  Yoshihiko Takano  Takayuki Muro  Yukako Kato  Hiroshi Kumigashira  Masaharu Oshima  Hisatomo Harima  Yoshihiro Aiura  Hitoshi Sato  Akihiro Ino  Hirofumi Namatame  Masaki Taniguchi  Masaaki Hirai  Yuji Muraoka
Abstract:We have characterized the electronic structure of FeSe1−xTex for various x values using soft x-ray photoemission spectroscopy (SXPES), high-resolution photoemission spectroscopy (HRPES) and inverse photoemission spectroscopy (IPES). The SXPES valence band spectral shape shows that the 2 eV feature in FeSe, which was ascribed to the lower Hubbard band in previous theoretical studies, becomes less prominent with increasing x. HRPES exhibits systematic x dependence of the structure near the Fermi level (EF): its splitting near EF and filling of the pseudogap in FeSe. IPES shows two features, near EF and approximately 6 eV above EF; the former may be related to the Fe 3d states hybridized with chalcogenide p states, while the latter may consist of plane-wave-like and Se d components. In the incident electron energy dependence of IPES, the density of states near EF for FeSe and FeTe has the Fano lineshape characteristic of resonant behavior. These compounds exhibit different resonance profiles, which may reflect the differences in their electronic structures. By combining the PES and IPES data the on-site Coulomb energy was estimated at 3.5 eV for FeSe.
Keywords:FeSe(1−  x)Tex  soft x-ray photoemission spectroscopy  high-resolution photoemission spectroscopy  inverse photoemission spectroscopy  electronic structure
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