| Abstract: | A method is given for incorporating the effects of built-in test (BIT) into the life cycle cost of a given electronic system. A cost model is derived that captures the savings achieved by BIT through reducing the maintenance times, complexity of external test equipment, personnel skill levels, amount of spare parts, and the need for preventive maintenance. The model also includes such design considerations as false alarms, diagnostic errors, undetected faults, BIT hardware failures, and diagnostic ambiguity. |
