Dependence of characteristic diode parameters on sample temperature in Ni/epitaxy n-Si contacts |
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| Authors: | K. Ejderha, A. Zengin, &#x . Orak, B. Tasyurek, T. Kilin ,A. Turut |
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| Affiliation: | a Department of Physics, Faculty of Sciences and Arts, Bingöl University, Bingöl, Turkey;b Department of Physics, Faculty of Sciences, Ataturk University, 25240 Erzurum, Turkey;c Department of Physics, Faculty of Sciences and Arts, Erzincan University, Erzincan, Turkey |
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| Abstract: | |
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| Keywords: | Metal– semiconducror contact Schottky barrier height |
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