CMOS design technique to eliminate the stuck-open fault problem of testability |
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Authors: | Murray A.F. |
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Affiliation: | University of Edinburgh, Wolfson Microelectronics Institute, Edinburgh, UK; |
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Abstract: | A dynamic CMOS design style is described, which utilises both N-type and P-type logic blocks and avoids the problems in generating tests for stuck-open faults. The testability of the resultant logic is examined analytically and fault simulation results are presented. |
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