<Emphasis Type="Italic">In situ</Emphasis> imaging of layer-by-layer sublimation of suspended graphene |
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Authors: | Jian Yu Huang Liang Qi Ju Li |
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Affiliation: | (1) Center for Integrated Nanotechnologies (CINT), Sandia National Laboratories, Albuquerque, New Mexico 87185, USA;(2) Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA |
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Abstract: | An individual suspended graphene sheet was connected to a scanning tunneling microscopy probe inside a transmission electron
microscope, and Joule heated to high temperatures. At high temperatures and under electron beam irradiation, the few-layer
graphene sheets were removed layer-by-layer in the viewing area until a monolayer graphene was formed. The layer-by-layer
peeling was initiated at vacancies in individual graphene layers. The vacancies expanded to form nanometer-sized holes, which
then grew along the perimeter and propagated to both the top and bottom layers of a bilayer graphene joined by a bilayer edge.
The layer-by-layer peeling was induced by atom sublimation caused by Joule heating and facilitated by atom displacement caused
by high-energy electron irradiation, and may be harnessed to control the layer thickness of graphene for device applications.
![MediaObjects/12274_2010_1006_Fig1_HTML.jpg](/content/E48V263000008338/MediaObjects/12274_2010_1006_Fig1_HTML.jpg) |
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