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压电陶瓷微纳米伸缩量测试系统
引用本文:陈超,何玉琳,章海军.压电陶瓷微纳米伸缩量测试系统[J].光学仪器,2007,29(2):27-30.
作者姓名:陈超  何玉琳  章海军
作者单位:浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027
摘    要:介绍了一种压电陶瓷的微纳米伸缩量的测试系统。该系统是通过调节加在陶瓷管内外管壁上的电压变化来实现陶瓷管的伸缩,其驱动电压由计算机编程并经过D/A转换后输出,再依次通过低压和高压放大后加在陶瓷管壁上。压电陶瓷的伸缩量则由电感测微仪进行测定。实验结果表明,利用该系统可以很方便地测量压电陶瓷管的伸缩,其伸缩量随着电压的变化而变化,但并非成简单的线性关系,而是呈一条曲线。

关 键 词:压电陶瓷  伸缩量  电感测微仪
文章编号:1005-5630(2007)02-0027-04
收稿时间:2006/7/2
修稿时间:2006年7月2日

The testing system of micro-nano dilation of the piezoelectric ceramics
CHEN Chao,HE Yu-lin,ZHANG Hai-jun.The testing system of micro-nano dilation of the piezoelectric ceramics[J].Optical Instruments,2007,29(2):27-30.
Authors:CHEN Chao  HE Yu-lin  ZHANG Hai-jun
Abstract:This paper introduces a testing system which can measure the micro-nano dilation of the piezoelectric ceramic.The dilation of the piezoelectric ceramic is actualized by adjusting the voltage which is applied between the inside and outside of the pipe.The voltage is generated by a D/A transfer controlled by computer;it is amplified by the low voltage and high voltage sequential.The dilation of the piezoelectric ceramics is measured by the inductance micrometer dial.The experimental results indicate that the system can measure the dilation of the piezoelectric ceramics simply and effectively.The dilation is non-linear with the voltage.
Keywords:piezoelectric ceramics(PZT)  dilation  inductance micrometer dial(IMD)
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