基于差频检测技术的高速AD单粒子翻转评估方法研究

本文基于差频检测的原理，提出一种在高频动态输入模式下，对高速高精度模数转换器（AD）的抗单粒子翻转效应进行评估的测试方法，并以一款8位3 GSPS高速AD为测试对象，设计开发了一套高速AD单粒子翻转效应测试系统，对目标器件进行了重离子试验。通过对试验结果的图像和错误数据进行分析，评估参试器件的抗辐照性能参数，为抗辐照高速高精度AD的加固设计提供数据支撑。

SEU Characterization of High-speed Analog-to-digital Converter Based on Beat Frequency

A single event upset (SEU) effect test method using a beat frequency to test the high-speed analog-to-digital converter (AD) with a high frequency dynamic input was proposed. The test method was demonstrated on a 8 bit 3 GPSP AD using different types and energy of heavy ions with a SEU effect test system. By the analysis of the test figure and the error data, the parameter of device can be calculated, providing basis and guidance for high-speed AD’s radiation harden design.