Effects of Interface Roughness on Residual Stresses in Thermal Barrier Coatings |
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| Authors: | Chun-Hway Hsueh James A. Haynes Michael J. Lance Paul F. Becher Mattison K. Ferber Edwin R. Fuller Stephen A. Langer W. Craig Carter W. Roger Cannon |
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| Affiliation: | Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6068;Department of Ceramics and Materials Engineering, Rutgers University, Piscataway, New Jersey 08855;National Institute of Standards and Technology, Gaithersburg, Maryland 20899 |
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| Abstract: | Using a newly developed object-oriented finite-element analysis method, both an actual microstructure and model microstructures of a plasma-sprayed thermal barrier coating system were numerically simulated to analyze the full-field residual stresses of this coating system. Residual stresses in the actual microstructure were influenced by both the irregular top-coat/bond-coat interface and cracks in the top coat. By treating the microcracked top coat as a more-compliant solid microstructure, the effects of the irregular interface on residual stresses were examined. These results then could be compared to results that have been obtained by analyzing a model microstructure with a sinusoidal interface, which has been considered by some earlier investigators. |
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