Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti-6Al-4V alloy |
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| Authors: | P Castany M Legros |
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| Affiliation: | a CEMES/CNRS, BP 94347, 31055 Toulouse Cedex 4, France
b INSA de Rennes, UMR CNRS 6226 SCR/Chimie-Métallurgie, 20 avenue des Buttes de Coësmes, CS70839, 35708 Rennes Cedex 7, France |
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| Abstract: | The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy. |
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| Keywords: | In situ straining Transmission electron microscopy (TEM) Focused ion beam (FIB) Dislocation dynamics Titanium alloy Nitridation |
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