基于边界扫描的板级动态扫描链路设计策略

边界扫描技术是一种新型的VLSI电路测试及可测性设计方法。但是在扫描链路的设计中如何将不同厂家、不同型号、不同工作电压的Bs器件实现JTAG互连，如何将边界扫描测试、在线编程和在线仿真结合起来一直是一个亟待解决的问题。为了解决上述问题，文中提出了两种基于边界扫描技术的板级动态链路设计方法。该方法不仅能完成边界扫描测试，还能完成在线编程或在线仿真等功能，具有很好的测试设计灵活性。

Design Strategy of Board Level Dynamic BS Chain Based on Boundary Scan Technology

Boundary-scan technology (BST) is a new and effective way for test and design-for-testability(DFT) of VLSI circuits. In the process of practical application of BST ,we were faced with some problems requring sohetion immediately, such as how to achieve the JTAG interconnection among the boundary scan (BS) devices coming from different manufacturers, of different types and having different working voltages, as well as how to combine BS testing, in-system-programming (ISP) and in-system-emulation together. To resolve them, two design methods of board level dynamic BS chain based on boundary scan technology are proposed in this paper. They have good flexibility for DFT.