| HDMI接口的ESD防护设计 |
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| 引用本文： | 韩晓轩. HDMI接口的ESD防护设计[J]. 电子质量, 2009, 0(6): 65-67 |
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| 作者姓名： | 韩晓轩 |
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| 作者单位： | TCL集团股份有限公司多媒体电子研发中心,广东,深圳,518067 |
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| 摘 要： | HDMI 1．3中实现了较高的分辨率和像素深度，集成电路制造商已经持续地缩小了它们的器件中的晶体管、互连和SiO2绝缘层的尺寸，这就导致高速器件的结构更小．因而在较低的能级也易于受到击穿效应的破坏。在发生ESD的时候，SiO2层很可能断裂，金属线很可能开路或桥接。
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| 关 键 词： | 高清晰度多媒体接口 静电放电 |
ESD Protection Design Issues for HDMI |
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| Han Xiao-xuan. ESD Protection Design Issues for HDMI[J]. Electronics Quality, 2009, 0(6): 65-67 |
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| Authors: | Han Xiao-xuan |
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| Affiliation: | Han Xiao- xuan(TCL Corporation Multimedia Electronics R&D Center,Guangdong Shenzhen 518067) |
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| Abstract: | While achieving higher resolutions and pixel depths in HDMI 1.3, integrated circuit manufacturers have continued to decrease the minimum dimensions of the transistors, interconnections, and the SiO2 insulation layers in their devices. This results in smaller structures for higher speed devices which are more susceptible to breakdown damage at lower energy levels. SiO2 layers are more likely to rupture and metal traces are more likely to open or bridge during an ESD event. |
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| Keywords: | HDMI ESD |
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