| 电子产品失效率的Bayes估计 |
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| 引用本文： | 方正,朱建新,高增梁,杨铁成.电子产品失效率的Bayes估计[J].机电产品开发与创新,2007,20(3):6-8. |
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| 作者姓名： | 方正 朱建新 高增梁 杨铁成 |
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| 作者单位： | 1. 浙江工业大学化工机械设计研究所,浙江,杭州,310032;浙江工业大学教育部机械制造与自动化重点实验室,浙江,杭州,310032
2. 合肥通用机械研究院,安徽,合肥,230031 |
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| 摘 要： | 电子元件失效率是安全联锁系统可靠性指标计算的重要基础.本文采用Bayes方法,对寿命分布服从指数分布的电子产品的失效率进行估算,推导了失效率点估计计算的公式.这种方法能够充分结合文献数据和工程试验数据,提高失效率的估算精度.算例表明该方法实用性强,有较好的的工程指导作用.
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| 关 键 词： | Bayes理论 指数分布 失效率 电子产品 失效率 Bayes 估计 Distributions Exponential Rates 作用 指导 算例 估算精度 试验数据 工程 文献数据 结合 公式 指标计算 效率点 指数分布 寿命分布 |
| 文章编号： | 1002-6673（2007）03-006-03 |
| 收稿时间： | 2007-04-02 |
| 修稿时间： | 2007年4月2日 |
Bayes Estimation of Invalid Rates in the Exponential Distributions |
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| FANG Zheng,ZHU Jian-Xin,GAO Zeng-Liang,YANG Tie-Cheng.Bayes Estimation of Invalid Rates in the Exponential Distributions[J].Development & Innovation of Machinery & Electrical Products,2007,20(3):6-8. |
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| Authors: | FANG Zheng ZHU Jian-Xin GAO Zeng-Liang YANG Tie-Cheng |
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| Affiliation: | 1.Institute of Process Equipment and Control Engineering, Zhejiang University of Technology, Hangzhou Zhejiang 310032, China;2 The MOE Key Laboratory of Mechanical Manufacture and Automation,Zhejiang University of Technology,Hangzhou Zhejiang 310032, China; 3. Hefei General Machinery Research Institute, Hefei Anhui 230031, China |
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| Abstract: | The failure rate of electronic component is the basis of the calculation of the reliability indices of the safety instrumented system. In this paper, evaluation method of invalid rates for the exponential distributions are proposed, based on the exact Bayes estimators considering the combination of the literature data and test data. The literature data and the test data are fully combined by the proposed method, which improve the accuracy of the estimation of the invalid rates. The results show that the proposed method is of good practicability and guidance in practice. |
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| Keywords: | Bayes theory Exponential distributions Invalid rates |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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