首页 | 本学科首页   官方微博 | 高级检索  
     

高功率微波效应的多物理场建模方法研究
引用本文:丁大志,成爱强,王林,张天成,陈如山.高功率微波效应的多物理场建模方法研究[J].电波科学学报,2020,35(1):93-105.
作者姓名:丁大志  成爱强  王林  张天成  陈如山
作者单位:南京理工大学, 南京 210094
基金项目:国家自然科学基金(61871228);空间微波技术国家重点实验室基金(2018SSFNKLSMT-06);电磁环境效应国家重点实验室基金(614220503030317)。
摘    要:为了实现对微波器件高功率微波效应的分析,主要从不同尺度半导体器件和波导器件出发,基于具有谱精度的谱元时域法,开展从微米尺度到纳米尺度半导体器件电热耦合一体化分析的方法以及高功率微波气体放电效应及抑制机理的研究.得到了半导体器件在电磁信号作用下发生的电热参数分布变化规律和微波器件在高功率微波下发生的气体放电及其抑制机理,根据以上相关效应机理,可为复杂电磁环境中的器件设计提供理论指导.

关 键 词:高功率微波    半导体器件    高功率微波气体放电    谱元时域法    多物理场
收稿时间:2019-11-16

Multi-physics modeling method of high power microwave effect
DING Dazhi,CHENG Aiqiang,WANG Lin,ZHANG Tiancheng,CHEN Rushan.Multi-physics modeling method of high power microwave effect[J].Chinese Journal of Radio Science,2020,35(1):93-105.
Authors:DING Dazhi  CHENG Aiqiang  WANG Lin  ZHANG Tiancheng  CHEN Rushan
Affiliation:Nanjing University of Science and Technology, Nanjing 210094, China
Abstract:In order to realize the analysis of microwave devices effected by high power microwave, we mainly studied the semiconductor devices with different scales and waveguide devices. Based on the spectral element method time domain(SETD) method owning spectral accuracy, we have performed the investigations of electro-thermal coupling analysis for semiconductor devices from the micron scale to the nano scale and the analysis for the gas discharge and its inhibition mechanism under the high power microwave environment. Finally, we obtained the variation law of electrical and thermal parameters inside the semiconductor devices effected by electromagnetic signals and gas discharge and its inhibition mechanism inside the microwave devices under the high power microwave environment. The related effect mechanism provids a theoretical guidance for the device design in the complex electromagnetic environment.
Keywords:high power microwave  semiconductor devices  high-power microwave gas discharge  SETD method  multi-physics
本文献已被 维普 等数据库收录!
点击此处可从《电波科学学报》浏览原始摘要信息
点击此处可从《电波科学学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号