LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms |
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| Authors: | Hui-Bin Zhao Jian-Xun Jin Pu-Chun Jiang Wen-Hui Gao Zi-Lu Liang |
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| Affiliation: | Center of Applied Superconductivity and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China |
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| Abstract: | This paper introduces the relevant parameters and related characteristics of the LabVIEW and PCI6221 data acquisition (DAQ) card, describes in detail the approach of building the measure and control platform of virtual instrument (VI) using LabVIEW and PCI6221, specifically discusses the system's application in high temperature superconductor (HTS) research including the test of HTS volt-ampere characteristics and the HTS magnetic energy storage. The experiments prove that the VI test and control system is easy to build and convenient to use. |
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| Keywords: | Data acquisition (DAQ) high temperature superconductor (HTS) HTS device HTS I-V measurement virtual instrument (VI) |
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