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直流盘形悬式绝缘子离子迁移测试系统的研究
引用本文:危鹏,胡文岐,刘志强,朱海涛,张源斌.直流盘形悬式绝缘子离子迁移测试系统的研究[J].电瓷避雷器,2007(2):12-15.
作者姓名:危鹏  胡文岐  刘志强  朱海涛  张源斌
作者单位:1. 国家绝缘子避雷器质量监督检验中心,陕西,西安,710077
2. 甘肃省电力局,甘肃,兰州,730000
3. 西安交通大学,陕西,西安,710049
摘    要:对直流盘形悬式绝缘子离子迁移过程进行了分析,认为离子迁移微观上表现为绝缘子内部某些金属正离子和自由电子的定向迁移。直流绝缘子离子迁移试验测量系统采用51系列单片机及其保护系统,运用C++ Builder计算机语言设计了一套实用软件,实现了离子迁移试验的自动控制、测量及52路微电流、52路体电阻、累积电荷的在线监测和相应的数据处理,提高了直流绝缘子离子迁移试验的准确度和工作效率。

关 键 词:直流悬式绝缘子  离子迁移  试验测量系统  51系列单片机
文章编号:1003-8337(2007)02-0012-04
修稿时间:2007-01-18

Research on Ion Migration and the Measuring and Testing System of D.C. Suspension Insulators
WEI Pen,HU Wen-qi,LIU Zhi-qiang,ZHU Hai-tao,ZHANG Yuan-bing.Research on Ion Migration and the Measuring and Testing System of D.C. Suspension Insulators[J].Insulators and Surge Arresters,2007(2):12-15.
Authors:WEI Pen  HU Wen-qi  LIU Zhi-qiang  ZHU Hai-tao  ZHANG Yuan-bing
Abstract:The ion migration process of D.C.Disc suspension insulator is analyzed,which considers that the ion migration microscopically performs as the directional migration of some metal positive ions and free electrons in the insulators.For ion migration measuring & testing of D.C.insulators,51 series MCU together with its protection system was adopted,using C++ Builder computer language to design a set of practical programs,which achieves the automatic control of ion migration test,the measurement of 52-loop micro-current and 52-loop volume resistance,the online monitoring of accumulated charge and the corresponding data processing,which enhances the accuracy and working efficiency of ion migration test of D.C.Insulator.
Keywords:D  C  suspension insulator  ion migration  testing & measuring system  51 series MCU
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