SIMS Analysis of Aqueous Corrosion Profiles in Soda-Lime-Silica Glass |
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| Authors: | R G GOSSINK H A M de GREFTE H W WERNER |
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| Affiliation: | Philips Research Laboratories, Eindhoven, The Netherlands |
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| Abstract: | In secondary ion mass spectrometry (SIMS) of glasses compensation of surface charging is necessary to avoid migration of mobile ions. A charge-compensation method, involving a metal diaphragm placed on the sample surface and a rastered primary ion beam, was tested on aqueous corrosion profiles in 20Na2O·10CaO·700SiO2 (mol%) glass. The method was effective with both O− and O2+ primary ions. |
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