Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements |
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| Affiliation: | 1. Departamento de Electrónica Física, Ingeniería Eléctrica y Física Aplicada, Universidad Politécnica de Madrid, Spain;2. Departamento de Teoría de la Señal y Comunicaciones, Universidad Politécnica de Madrid, Spain;1. Institute of Microelectronics of Chinese Academy of Sciences, 3rd Beitucheng West Road, Chaoyang Qu, 10029 Beijing, China;2. University of Chinese Academy of Sciences, 19th Yuquan Road, Shijingshan Qu, 100049 Beijing, China;1. Materials Center Leoben Forschung GmbH, Roseggerstraße 12, 8700 Leoben, Austria;2. Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration, Gustav-Meyer-Allee 25, 13355 Berlin, Germany;3. Tridonic Jennersdorf GmbH, Technologiepark 10, 8380 Jennersdorf, Austria;4. Häusermann GmbH, Zitternberg 100, 3571 Gars am Kamp, Austria;1. Department of Pediatrics, Minami Wakayama Medical Center, Wakayama;2. Department of Pediatrics, Kinki University Sakai Hospital, Osaka, Japan;4. Department of Pulmonary, Medicine, Kinki University Sakai Hospital, Osaka, Japan;3. Platform Development Center, Panasonic Corporation, Osaka, Japan. |
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| Abstract: | Electronic equipment frequently utilises low cost electret microphones. In this paper, a complete accelerated life-test on commercial electret microphones is presented using thermal chamber testing. The test was conducted on the microphones under study at three different temperatures. After each thermal probe, the electroacoustic characteristics of each transducer was analysed for obtaining the degradation model. In the literature such tests have been performed through charge losses on the electret materials. Life models were obtained for the degradation failures revealed from the tests and a complete temperature model was then developed, which can calculate the useful life of the microphones under any of these conditions. |
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