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Fault tolerant encoders for Single Error Correction and Double Adjacent Error Correction codes
Affiliation:1. Microelectronics Center, Harbin Institute of Technology, Harbin 150001, China;2. Aerospace Research and Innovation in Electronic Systems Center (ARIES), Universidad Antonio de Nebrija, C/Pirineos, 55, E-28040, Madrid, Spain;1. Amity Institute of Information Technology, Amity University Rajasthan, India;2. Department of Computer Science, University of York, UK;3. Department of Mechanical Engineering, University of California, Riverside, USA;4. School of Computing, University of Eastern Finland, Finland;1. School of Material Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore;2. School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore;3. Department of Engineering Science, Oxford University, Parks Road, Oxford OX1 3PJ, England
Abstract:Error correction codes (ECCs) are commonly used to deal with soft errors in memory applications. Typically, Single Error Correction-Double Error Detection (SEC-DED) codes are widely used due to their simplicity. However, the phenomenon of more than one error in the memory cells has become more serious in advanced technologies. Single Error Correction-Double Adjacent Error Correction (SEC-DAEC) codes are a good choice to protect memories against double adjacent errors that are a major multiple error pattern. An important consideration is that the ECC encoder and decoder circuits can also be affected by soft errors, which will corrupt the memory data. In this paper, a method to design fault tolerant encoders for SEC-DAEC codes is proposed. It is based on the fact that soft errors in the encoder have a similar effect to soft errors in a memory word and achieved by using logic sharing blocks for every two adjacent parity bits. In the proposed scheme, one soft error in the encoder can cause at most two errors on adjacent parity bits, thus the correctness of memory data can be ensured because those errors are correctable by the SEC-DAEC code. The proposed scheme has been implemented and the results show that it requires less circuit area and power than the encoders protected by the existing methods.
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