| OLED有源驱动TFT阵列的一种测试方法 |
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| 引用本文： | 刘雪强,张彤,王丽杰,夏志强,李明友,刘式墉.OLED有源驱动TFT阵列的一种测试方法[J].半导体学报,2007,28(7):1161-1164. |
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| 作者姓名： | 刘雪强 张彤 王丽杰 夏志强 李明友 刘式墉 |
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| 作者单位： | 吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012 |
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| 摘 要： | 提出了一种检测有源驱动OLED TFT阵列的方法，这种电流检测方法是结合TFT的制作工艺进行的. 在只增加一块光刻版的情况下，有效地解决了在含有2个TFT的单元像素电路中，检测驱动管困难的难题. 这种检测方法能够进行快速的全屏检测，具有精度高，对TFT阵列无损伤的特点.
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| 关 键 词： | TFT OLED 有源驱动 电流检测 仿真模拟 |
| 文章编号： | 0253-4177（2007）07-1161-04 |
| 修稿时间： | 3/7/2007 12:00:00 AM |
A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode |
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| Liu Xueqiang,Zhang Tong,Wang Lijie,Xia Zhiqiang,Li Mingyou and Liu Shiyong.A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode[J].Chinese Journal of Semiconductors,2007,28(7):1161-1164. |
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| Authors: | Liu Xueqiang Zhang Tong Wang Lijie Xia Zhiqiang Li Mingyou and Liu Shiyong |
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| Affiliation: | College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;College of Electronic Science and Engineering,Jilin University,Changchun 130012,China |
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| Abstract: | A novel method is used to evaluate the quality of a TFT array for an active matrix OLED,which can measure the characteristics of TFTs in a 2-T pixel circuit and detect the defects.The proposed testing method is carried out simultaneously with the fabrication processes.Without changing the fabrication processes,only one mask is added to judge the working states of the switch transistor and driving transistor in the pixel circuit.It is a current testing method,which has several advantages including fast response time,high precision,and no damage to the display. |
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| Keywords: | thin film transistor organic light emitting diode active matrix driving current test simulation |
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