| ICTSSE: An Object-Oriented IC Test Software Supporting Environment |
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| 引用本文： | Sun Yuning,Wang Xiaoming,Shi Wanchun. ICTSSE: An Object-Oriented IC Test Software Supporting Environment[J]. 计算机科学技术学报, 1995, 10(5): 447-454. DOI: 10.1007/BF02948340 |
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| 作者姓名： | Sun Yuning Wang Xiaoming Shi Wanchun |
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| 作者单位： | [1]InstituteofComputingTechnology,TheChineseAcademyofSciences,Beijing100080 [2]InstituteofComputingTechnolo,TheChineseAcademyofSciences,Beijing100080 |
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| 摘 要： | An IC test software supporting environment-ICTSSE,which supports the migration and simulation of test pattern programs on heterogeneous ATEs,is presented.ICTSSE is a subsystem of Test Development System (TeDS).It has the capabilities of verifying the IC‘s stimulus/response vectors and associated timing resources against the target ATE.The general data interchange format,which is the center of the TeDS,is built for test pattern migration.
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| 关 键 词： | IC 检测 CAD 集成电路 软件开发 支持环境 |
ICTSSE: An object-oriented IC test software supporting environment |
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| Yuning Sun,Xiaoming Wang,Wanchun Shi. ICTSSE: An object-oriented IC test software supporting environment[J]. Journal of Computer Science and Technology, 1995, 10(5): 447-454. DOI: 10.1007/BF02948340 |
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| Authors: | Yuning Sun Xiaoming Wang Wanchun Shi |
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| Affiliation: | Institute of Computing Technology; The Chinese Academy of Sciences; Beijing 100080; |
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| Abstract: | An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration. |
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| Keywords: | CAT object-oriented paradigm data interchanging format |
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