Ellipsometric Study of Superfluid Onset in Thin Liquid 4Helium Films

We have developed a modulated null ellipsometer capable of measuring single layers of adsorbed ⁴He films at 1.4 K. The small optical index of liquid helium, the extreme sensitivity to temperature gradients, and the requirement of sub-monolayer stability over many hours presents significant experimental challenges, which will be briefly discussed. The main goal of our experiments is to independently measure the superfluid and normal coverage in thin adsorbed ⁴He films. This is a particularly important issue for helium films on intermediate strength substrates such as rubidium and thin cesium, where previous measurements indicate that prewetting and the Kosterlitz-Thouless transition interact strongly, and the K-T transition appears to have nonuniversal features. Independent determination of the superfluid and normal fraction can be accomplished by using the ellipsometer in conjunction with a quartz crystal micro balance (QCM). QCM measurements rely on viscous coupling of the fluid layers, and therefore respond only to the normal component of a ⁴He film. In contrast, the ellipsometer is sensitive to the total thickness, independent of the state (superfluid or normal) of the film. By combining the QCM and ellipsometric measurements we can determine the total coverage, the normal fluid component and thus the superfluid fraction.