| A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales |
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| 作者姓名： | YuhaiQIAN MeishuanLI |
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| 作者单位： | ShenyangNationalLaboratoryforMaterialsScience,InstituteofMetalResearch,ChineseAcademyofSciences,Shenyang110016,China |
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| 摘 要： | A kind of new deflection technique has been developed for measuring the growth stress of thermally growing oxide scales during high temperature oxidation of alloys. The average growth stresses in oxide scales such as Al2O3, NiO and Cr2O3 formed on the surface of the superalloys can be investigated by this technique. Unlike the comventional deflection method, the novel method does not need to apply a coating for preventing one main face of thin strip specimen from oxidizing and can be used under the condition of longer time and higher temperature.
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| 关 键 词： | 偏转法 氧化物薄膜 超耐热合金 防护涂层 |
A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales |
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| YuhaiQIAN MeishuanLI.A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales[J].Journal of Materials Science & Technology,2003,19(3):231-234. |
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| Authors: | Yuhai QIAN Meishuan LI |
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| Affiliation: | Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China |
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| Abstract: | A kind of new deflection technique has been developed for measuring the growth stress of thermally growing oxide scales during high temperature oxidation of alloys. The average growth stresses in oxide scales such as Al2O3, NiO and Cr2O3 formed on the surface of the superalloys can be investigated by this technique. Unlike the comventional deflection method, the novel method does not need to apply a coating for preventing one main face of thin strip specimen from oxidizing and can be used under the condition of longer time and higher temperature. |
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| Keywords: | Oxide film Growth stress Deflection method |
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