Ageing of V2O5 thin films induced by Li intercalation multi-cycling

Cyclic voltammetry, XPS, RBS and AFM have been combined to study the ageing mechanism of Li intercalation in V₂O₅ thin films prepared by thermal oxidation of vanadium metal. Multi-cycling tests were performed in 1 M LiClO₄-PC in the potential range E ∈ [3.8, 2.8 V] versus Li/Li⁺, corresponding to the α-to-δ phase transition. XPS and AFM were performed using direct anaerobic and anhydrous transfer. Capacity fading remains inferior to 20% during ∼2500 cycles. XPS shows slight modifications of the oxide composition with a V⁴⁺ concentration increasing from ∼5% prior to cycling to ∼16–27% after cycling, due to Li trapped in the oxide film and to the loss of V₂O₅ active material. The presence of lithium carbonate and lithium-alkyl carbonate species evidences the formation of the so-called SEI layer. AFM evidences the loss of crystalline material by grain exfoliation from the outer V₂O₅ layer of the oxide film. By further exfoliation, the inner VO₂ layer of the oxide film is reached and pits are formed, occupying ∼9–13% of the surface. This de-cohesion at grain boundaries is attributed to the strain generated by repeated lattice distortions. After 3300 cycles, the disappearance of lithium carbonates, whereas Li-alkyl carbonates and/or Li-alkoxides remain on the surface, indicates the dissolution and/or conversion of the SEI layer. After 4500 cycles, the oxide film became very labile and could be stripped away by rinsing to reveal the vanadium metal substrate.