Computer-aided system for measuring the static parameters of semiconductor devices

A computer-aided system for measuring the static parameters of semiconductor devices is described. The system is controlled by a personal computer. A hierarchy of models is formed from the results of the measurements from the simplest behavioral models to the accurate physical models used in computer-aided design systems. Translated from Izmeritel'naya Tekhnika, No. 12, pp. 49–52, December, 1996.