Global analyses of crisis and stochastic bifurcation in the hardening Helmholtz-Duffing oscillator |
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Authors: | XU Wei & YUE XiaoLe |
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Affiliation: | XU Wei & YUE XiaoLe Department of Applied Mathematics,Northwestern Polytechnical University,Xi'an 710072,China |
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Abstract: | Crisis and stochastic bifurcation of the hardening Helmholtz-Duffing oscillator are studied by means of the generalized cell mapping method using digraph.For the system subject to a single deterministic harmonic excitation,our study reveals that a series of crisis phenomena can occur when the system parameter passes through different critical values,including chaotic boundary crisis,regular boundary crisis and interior crisis.A chaotic boundary crisis due to the collision of regular attractor with chaotic s... |
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Keywords: | crisis stochastic bifurcation hardening Helmholtz-Duffing oscillator generalized cell mapping method using digraph |
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