一起继电保护装置单粒子翻转软错误分析及应对措施

微机继电保护装置中大量使用各种芯片及存储器件,器件失效将影响电力系统的稳定运行。结合一起由于单粒子翻转引起的保护装置动作行为,分析了保护装置的动作原因,提出了在微机继电保护装置中存在的单粒子翻转的问题。对单粒子翻转的机制、特点及影响进行分析,并从芯片选型、硬件架构、软件架构等方面提出一整套完善的方案。在继电保护装置设计中应用所提出的方案可有效减少单粒子翻转对继电保护装置的影响,对于继电保护装置和电力系统的稳定安全运行具有重要的意义。

Analysis and countermeasures of single event upset soft errors in a relay protection device

Various chips and storage devices are widely used in microcomputer relay protection devices. A failure of the device will affect the stable operation of the power system. The cause of the protection device action, combined with a malfunction of the protection device caused by a single event upset is analyzed, and the problem of single event upset is determined. The mechanism, characteristics and effects of the single event upset are analyzed, and a complete method to tackle this based on chip selection, hardware architecture, software architecture, etc. is proposed. The solution proposed in the paper is applied to the design of a relay protection device. It can effectively reduce the impact of a single event upset on a relay protection device. This is of significance for the stable and safe operation of relay protection devices and power systems. This work is supported by the National Key Research and Development Program of China (No. 2018YFB0904900 and No. 2018YFB0904903).