| 基于遗传算法的模拟电路故障诊断激励优化 |
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| 引用本文： | 殷时蓉,陈光(礻禹),谢永乐. 基于遗传算法的模拟电路故障诊断激励优化[J]. 测控技术, 2007, 26(6): 20-22 |
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| 作者姓名： | 殷时蓉 陈光(礻禹) 谢永乐 |
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| 作者单位： | 电子科技大学,自动化工程学院CAT室,四川,成都,610054;电子科技大学,自动化工程学院CAT室,四川,成都,610054;电子科技大学,自动化工程学院CAT室,四川,成都,610054 |
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| 摘 要： | 介绍了用改进的遗传算法优化激励信号的参数.仿真实验表明,经过优化后的激励信号能大大提高模拟电路的故障诊断效率,对线性和非线性模拟电路都适用.
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| 关 键 词： | 遗传算法 模拟电路 故障诊断 |
| 文章编号： | 1000-8829（2007）06-0020-03 |
| 修稿时间： | 2006-08-28 |
Optimizing the Stimulus of Analog Circuits Diagnosis Based on Genetic Algorithm |
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| YIN Shi-rong,CHEN Guang-ju,XIE Yong-le. Optimizing the Stimulus of Analog Circuits Diagnosis Based on Genetic Algorithm[J]. Measurement & Control Technology, 2007, 26(6): 20-22 |
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| Authors: | YIN Shi-rong CHEN Guang-ju XIE Yong-le |
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| Affiliation: | Computer Aided Test Lab., School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China |
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| Abstract: | The improved genetic algorithm is used to search the optimum stimulus. Experiment results demonstrate that the optimum stimulus has high fault identification. The method can be applied to linear and nonlinear analog circuits. |
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| Keywords: | genetic algorithm analog circuits fault diagnosis |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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