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Intensity gradient techniques for orientation analysis of electron micrographs
Authors:N. K. Tovey  P. Smart
Abstract:The variation in intensity between neighbouring picture points on an electron micrograph may be used to define an intensity gradient vector. This vector is related to the orientation of the feature at that point, and may be compared with similar vectors at all other points within the micrograph to obtain a quantitative measure of anisotropy. Alternatively, the results may be displayed graphically as a rosette diagram. This paper compares the results from using a simple ‘5-point’, i.e. the nearest neighbours with those from alternative formulations for the intensity gradient vector. Generally, the increased number of points improves the shape of the rosette diagram by minimizing the likelihood of pronounced ‘spikes’ at certain critical angles which is a feature of the ‘5-point’ method. The improved analysis requires an extra 60% computing time, which may be of significance if direct on-line work is contemplated. Some examples of micrographs of soil microfabric are presented to illustrate the different methods.
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