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Quantitative microlocalization of diffusible ions in normal and galactose cataractous rat lens by secondary ion mass spectrometry |
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| Authors: | Margaret S. Burns David M. File |
| Abstract: | Secondary ion mass spectrometry (SIMS) is a surface analytical technique with high sensitivity for elemental detection and microlocalization capabilities within the micrometre range. Quantitative analysis of epoxy resins and gelatin have been reported (Burns-Bellhorn & File, 1979). |
| Keywords: | Secondary ion mass spectrometry lens calcium sodium potassium galactose cataract rat elemental localization quantitation |