| 局部放电测量仪校准装置的研制与应用 |
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| 引用本文： | 彭黎迎,徐艳秋,丁太春,贺明志,许睿. 局部放电测量仪校准装置的研制与应用[J]. 现代电子技术, 2011, 34(7): 175-177 |
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| 作者姓名： | 彭黎迎 徐艳秋 丁太春 贺明志 许睿 |
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| 作者单位： | 河南省产品质量监督检验院,河南郑州,450004 |
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| 摘 要： | 局部放电测量仪校准装置是根据国家计量标准和高新科学技术设计和研制而成的,采用虚拟数据采集技术,进行数字积分,按照q=It的方法来实现对局部放电（电量单位：皮库（pC））的测量。该校准装置能够按照标准的规定对局部放电测量仪进行全面的校准,具有半智能化、精度高、感应灵敏、操作方便等优点,对于提高电器产品的安全性能和产品质量很有帮助,是一种应用广泛的重要安全试验仪器。
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| 关 键 词： | 校准装置 数据采集技术 半智能化 产品质量 |
Development and Application About Calibrating Device of Shelf Depreciation Measuring Instrument |
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| PENG Li-ying,XU Yan-qiu,DING Tai-chun,HE Ming-zhi,XU Rui. Development and Application About Calibrating Device of Shelf Depreciation Measuring Instrument[J]. Modern Electronic Technique, 2011, 34(7): 175-177 |
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| Authors: | PENG Li-ying XU Yan-qiu DING Tai-chun HE Ming-zhi XU Rui |
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| Affiliation: | PENG Li-ying,XU Yan-qiu,DING Tai-chun,HE Ming-zhi,XU Rui(Henan Testing Institute of Product Quality Supervision,Zhengzhou 450004,China) |
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| Abstract: | The calibrating device of shelf depreciation measuring instrument was developed and designed according to the national measurement standard and the high technology,which used the virtual data gathering technology,carried on the digital integration,realized measurement to the shelf depreciation(pC) through the q=It method.This calibrating device can calibrate the shelf depreciation measuring instrument according to the standard stipulation,which has half intellectualization,high precision,sensitive induction... |
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| Keywords: | calibrating device data acquisition technology half intellectualization product quality |
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