A comparison between NRZ and RZ data formats with respect toPMD-induced system degradation |
| |
| Authors: | Sunnerud H Karlsson M Andrekson PA |
| |
| Affiliation: | Dept. of Microelectron., Chalmers Univ. of Technol., Goteborg; |
| |
| Abstract: | We quantify the polarization-mode dispersion (PMD)-induced system outage probability by means of numerical simulations for nonreturn-to-zero (NRZ) and return-to-zero (RZ) data formats with proper comparative conditions and find that RZ performs better than NRZ. We also study the impact of the RZ duty-factor and the tradeoff between power margin and acceptable PMD |
| |
| Keywords: | |
|
