J750型SOC测试系统校准技术概述

SOC芯片是武器装备、大飞机计划、探月工程等国防重要工程的核心电子器件,也是信息社会的基础和关键器件,SOC芯片的性能直接关系到电子装备的质量,SOC芯片的测试需求对SOC测试系统的量值提出了苛刻的要求.文章简单介绍了SOC测试系统的主要校准方案,重点阐述了如何使用分项参数校准法对广泛应用于国内外集成电路测试的J750...

The Summary of the Calibration Method of J750 of SOC ATE

A System on chip(SOC) design consists of multiple individual design blocks,or cores,using different technologies(logic,memory,analog,RF,etc),and it is the fundamental device of the military equipment,China airplane program,lunar probe program and the important device in the information science fields.The specification of the SOC will influence the quality of the electronic equipment,and the test challenge requires the accurate and traceable ATE.The paper mention the summary of the calibration method of SOC ATE,and emphasize how to calibrate the Teradyne J750 that is one of the classical SOC test systems widely used in the semiconductor industry.