| 存储器故障诊断算法的研究与实现 |
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| 引用本文： | 刘炎华,景为平.存储器故障诊断算法的研究与实现[J].电子与封装,2006,6(12):23-25,48. |
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| 作者姓名： | 刘炎华 景为平 |
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| 作者单位： | 东南大学集成电路学院,南京,210096;南通大学,江苏,南通,226007 |
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| 基金项目： | 国家自然科学基金;江苏省高科技研究资助项目 |
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| 摘 要： | 集成电路工艺的改进使存储器的测试面临着更大的挑战。文中从存储器的故障模型入手,着重描述了存储器常见的诊断算法。诊断算法和诊断策略要在诊断时间、故障覆盖率、面积开支之间进行权衡。因此要根据存储器的故障类型和测试需求来选择合适的诊断算法,才能达到比较满意的效果。
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| 关 键 词： | 存储器测试 故障模型 诊断算法 故障覆盖率 |
| 文章编号： | 1681-1070（2006）12-0023-03 |
| 收稿时间： | 2006-05-22 |
| 修稿时间： | 2006-05-22 |
Research and Implement of Memory Diagnostic Algorithms |
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| LIU Yan-hua,JING Wei-ping.Research and Implement of Memory Diagnostic Algorithms[J].Electronics & Packaging,2006,6(12):23-25,48. |
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| Authors: | LIU Yan-hua JING Wei-ping |
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| Affiliation: | 1.School of IC, Southeast University, Nanjing 210096, China; 2. Nantong University, Nantong 226007, China |
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| Abstract: | Test of memory faces enormous challenge because of the semiconductor technology progress. This paper discussed several classical fault diagnostic algorithms for memories based on some fault models, diagnostic algorithms and diagnostic tactic should steer a middle course among diagnostic time, fault coverage and area expense, In order to get a famous production,we should choose appropriate algorithms dase on memory faults and diagnonsis requirement. |
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| Keywords: | memory diagnosis fault model diagnostic algorithms fault coverage |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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