原位聚合 ( PSS/ PANI) n复合膜的静电层2层自组装

基于静电相互作用 , 从苯胺单体出发原位聚合、现场掺杂、层2层自组装制备多层聚苯乙烯磺酸钠( PSS) /聚苯胺 ( PANI) 复合膜。为了明确控制 PSS/ PANI复合膜纳米结构的因素 , 以紫外2可见 (UV2Vis) 光谱跟踪 PSS/ PANI复合膜的成膜过程 , 系统地研究了基片性质、 氧化剂用量及沉积时间等溶液因素对单个双层复合膜纳米结构的影响 , 得到了制备单个双层复合膜的较优条件。在此基础上变换苯胺单体浓度 , 制备了不同纳米结构的多层复合膜 ( PSS/ PANI) n, 并用原子力显微镜 (AFM) 、 扫描电镜 (SEM) 及椭偏仪等对该多层复合薄膜的形貌结构进行了表征。结果表明 , 通过控制沉积条件 , 每双层复合膜的厚度可控制在 40～100 nm , 电导率可达- 12. 675 mS·cm , 并且可制备增长均匀的 8 个双层的 ( PSS/ PANI) 8复合膜。热失重分析 ( TGA) 表明 , ( PSS/ PANI) n多层复合膜的热稳定性优于普通 PSS/ PANI复合膜。

Layer-by-layer self-assembly of in-situ polymerized (PSS/PANI)n composite films based on electrostatic interaction

The sodium polystyrene sulfonate ( PSS) / polyaniline ( PANI) composite films were prepared f romaniline (AN) monomers by in2situ polymerization , self2acid2doping and layer2by2layer self2assembly through the e-lect rostatic force. In order to completely know the factors to cont rol the nanost ructure , the progress of polymeriza2 tion of the PSS/ PANI films was monitored by the UV2Vis spect ra , and the influences of reaction conditions , such as subst rates , amount s of oxidant , and dipping time on the st ructure of PSS / PANI composite films were also stud2 ied. The ( PSS/ PANI) ncomposite films with different nanost ructures were then prepared at different aniline concen2 t rations. Atomic force microscope (AFM) , field emission scanning elect ron microscope ( FESEM) and ellipsomet rywere employed to characterize the ( PSS/ PANI) n composite films. By optimizing the deposition conditions , the thickness of the PSS/ PANI bilayer was cont rolled within 40～100 nm and the elect rical conductivity of the PSS/ - 1 PANI bilayer was 2. 675 mS ·cm . The uniform ( PSS/ PANI) 8 composite films were also prepared under the optimumconditions. The result s of the thermal gravimet ry analysis ( TGA) showed that the thermal stability of ( PSS/ PANI) ncomposite films was st ronger than that of general PANI / PSS composite films.