Real-Time Adaptive Test Algorithm Including Test Escape Estimation Method

This work aims to reduce the test time per chip, but affect the quality of the products only as little as possible compared to the conventional semiconductor test. For that purpose, a simulation software has been developed that performs adaptive test simulations based on real data and test results of conventional production testing. Products has been analyzed and both the potential for test time savings and the resulting loss of quality are determined. Finally, it is shown that by the intelligent omission of tests, compared to conventional testing procedures, test time reduction of up to 50 % can be achieved. In contrast, there are only few defective components that are not detected by the adaptive test procedure and which reduced the quality of products. In best case, the fraction of test escapes was under 40 ppm. To handle the potential risk of test escapes this paper also introduces a statistical estimation method.