| 扫描法可测性设计中扫描触发器的最优实现 |
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| 引用本文： | 叶波 郑增钰. 扫描法可测性设计中扫描触发器的最优实现[J]. 微电子学, 1995, 25(6): 53-55 |
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| 作者姓名： | 叶波 郑增钰 |
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| 作者单位： | 复旦大学专用集成电路与系统国家重点实验室，复旦大学电子工程系 |
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| 摘 要： | 提出了扫描法可测性设计中扫描触发器的最优实现方法，采用该方法每个触发器仅需增加２个ＭＯＳ管即可构成扫描触发器，比用传统方法减少１２个ＭＯＳ管，而增加的额外管脚数与传统方法一样。这样，即使采用全扫描设计，也仅需较小的芯片面积。
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| 关 键 词： | 数字集成电路 可测性设计 触发器 |
An Optimal Implementation of Scannable Flip-Flops in Design for Testability With Scanning Method |
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| Ye Bo,Zheng Zeng Yu. An Optimal Implementation of Scannable Flip-Flops in Design for Testability With Scanning Method[J]. Microelectronics, 1995, 25(6): 53-55 |
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| Authors: | Ye Bo Zheng Zeng Yu |
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| Abstract: | An optimal implementation of scannable flip- flops in testability design using scanning method is proposed,in which each flip-flop can become a scannable flip- flop by adding only 2 MOS transistors.Compared with traditional technique,12 MOS transistors are reduced,while extra pins remain the same. Thus,only a very small extra chip area is required even if full scan design is used. |
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| Keywords: | Digital IC Flip-flop Design for testability Reliability design |
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