Mechanical properties and indentation-induced damage of high-quality ZnO microwires |
| |
Authors: | Zhiwei Liu Xiaoqin Yan Zhi Lin Yunhua Huang Hanshuo Liu Yue Zhang |
| |
Affiliation: | 1. ISM-CNR, Area della Ricerca Roma1, Via Salaria km 29.300, Monterotondo Scalo (RM), Italy;2. Dipartimento di Fisica e Astronomia, Università di Bologna, I-40127 Bologna, Italy;3. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, BP 220, 38043 Grenoble Cedex 9, France |
| |
Abstract: | In this paper, we aim to discover the mechanics-related novel phenomena on high-quality ZnO microwires through nanoindentation method. The mechanical property parameters of ZnO microwires were determined and a distinctive creep damage phenomenon was revealed. By using the cycles load mode in the nanoindentation experiments, the indentation size effect was demonstrated to exist in the ZnO microwires: the elastic modulus ranged from 65.9 GPa to 12.3 GPa and the hardness changed from 11.1 GPa to 1.8 GPa with the increase of indentation depth. Furthermore, the indentation-induced mechanical and electrical damage caused a permanent plastic deformation and an increase of 41% in the longitudinal conductance of the ZnO microwires. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|