Spectroscopic studies on DLC/TM (Cr,Ag, Ti,Ni) multilayers |
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| Authors: | S. Gayathri R. Krishnan T.R. Ravindran S. Tripura Sundari S. Dash A.K. Tyagi Baldev Raj M. Sridharan |
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| Affiliation: | 1. Holon Institute of Technology, Holon 5810201, Israel;2. Fraunhofer Institute for Mechanics of Materials IWM, Woehlerstr. 11, 79108 Freiburg, Germany;1. International Chinese-Belarusian Scientific Laboratory on Vacuum-Plasma Technology, Nanjing University of Science and Technology, Nanjing 210094, China;2. Francisk Skorina Gomel State University, Gomel 246019, Belarus;3. Faculty of Material Science and Technology, Slovak University of Technology, Trnava 91724, Slovakia |
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| Abstract: | The hydrogen-free diamond-like carbon (DLC) films with transition metal (TM = Cr, Ag, Ti, Ni) interlayer (bilayer and multilayer) were deposited on to stainless steel and silicon substrates using pulsed laser deposition technique. Secondary ion mass spectroscopy (SIMS) confirmed that the films were hydrogen free. Incorporation of chromium inter layer reduced the stress value by about 3 GPa as determined by micro Raman spectroscopy. Incorporation of the TM inter layer enhanced the photoluminescence (PL) intensity as compared to the monolithic DLC films. The optical band gap determined by spectroscopic ellipsometry for DLC/TM films was found to be in the range of 1.56–1.67 eV. |
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