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数字化红外焦平面探测器光谱响应测试系统研究
引用本文:陈彦冠,王亮,李进武,王成刚,于艳. 数字化红外焦平面探测器光谱响应测试系统研究[J]. 红外, 2020, 41(9): 31-36. DOI: 10.3969/j.issn.1672-8785.2020.09.005
作者姓名:陈彦冠  王亮  李进武  王成刚  于艳
作者单位:华北光电技术研究所,北京100015;华北光电技术研究所,北京100015;华北光电技术研究所,北京100015;华北光电技术研究所,北京100015;华北光电技术研究所,北京100015
摘    要:由于目前没有可测试数字化红外探测器光谱响应的设备,研制了一种可将数字化红外探测器的输出转换为与模拟探测器一样形式的电路板装置,并利用原有的傅里叶光谱仪解决了无法测试数字化红外探测器光谱的问题。该方法成本低、易实现,不仅操作简单,而且测试性能稳定,因此适用于各种形式的数字化探测器。首先介绍了红外光谱响应测试系统,然后对研制的模数电路板装置的原理进行了分析,并对此电路板进行了硬件实现,接着编写了内部测试程序,最后完成了功能验证。结果表明,配有新研制模数电路板装置的红外光谱测试系统可以测试不同位宽输出的数字化面阵探测器或线列探测器的光谱数据,而且测试结果准确可靠。

关 键 词:光谱响应测试  数字化红外探测器  傅里叶光谱仪  兼容性
收稿时间:2020-07-08
修稿时间:2020-07-19

Research on Spectral Response Test System of Digitalization Infrared Focal Plane Detector
Chen Yanguan,Wang Liang,Li Jinwu,Wang Chenggang and Yu Yan. Research on Spectral Response Test System of Digitalization Infrared Focal Plane Detector[J]. Infrared, 2020, 41(9): 31-36. DOI: 10.3969/j.issn.1672-8785.2020.09.005
Authors:Chen Yanguan  Wang Liang  Li Jinwu  Wang Chenggang  Yu Yan
Affiliation:North China Research Institute of Electro-optic,North China Research Institute of Electro-optic,North China Research Institute of Electro-optic,North China Research Institute of Electro-optic,North China Research Institute of Electro-optic
Abstract:There is currently no equipment that can test the spectral response of digital infrared detectors. Therefore, a circuit board device is developed to convert the output of the digital infrared detector into the same output form as the analog detector. The original Fourier spectrometer is used to solve the problem that the digital infrared detector spectrum can not be tested. This method is low in cost, easy to implement, simple in operation, and stable in test performance, and is suitable for various forms of digital detectors. First, the infrared spectrum response test system is introduced, and then the principle analysis of the developed analog-to-digital circuit board is carried out. Finally, this circuit board is implemented in hardware, and the internal test program is written to complete the functional verification. The result shows that the infrared spectrum test system with the newly developed analog-digital circuit board device can test the spectrum of digital area array detectors or linear detectors with different bit width outputs, and the test results are accurate and reliable.
Keywords:spectral response test   digital infrared detector   Fourier spectrometer   compatibility
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