光谱辐射测量金属薄膜桥电爆炸温度

采用光谱辐射法测量了Ni-Cr金属薄膜桥的电爆炸温度。通过六通道瞬态光学高温计测量金属薄膜桥电爆炸时在514nm、631nm、692nm、715nm、910nm、1068nm波长处的辐照强度，根据黑体辐射理论计算温度值。研究表明，金属薄膜桥在50V、100μF条件下电爆炸时的最高温度在5000K左右，4000K以上持续时间为300ns。

Electrical Explosion Temperature of Metal Thin Film Bridge Measured by Spectrum Radiation Method

The electrical explosion temperature of Ni-Cr thin film bridge was studied by the spectrum radiation method. The radiation intensity was measured at wavelength of 514 nm,631 nm,692 nm,715 nm,910 nm,1068 nm via six-channel instantaneous optical pyrometer,respectively, when metal thin film bridge fired, and then the ignition temperature was calculated based on blackbody radiation theory. Results shows that when metal thin film bridge is exploded in the conditions of 50 V and 100 μF,the maximum temperature is around 5000 K, and the duration time which the temperature is maintained above 4000 K is 300 ns.