Mesure des circuits monolithiques hyperfréquences base d’une bonne conception

The aim of this article is to show how important are the measurements to design Microwave Monolithic Integrated Circuits. The following items will be discussed : the existing links between tests and modeling of linear devices, the creation of a measurement station, the use of an on-wafer accurate calibration procedure, and the utilization of these tests for circuit design. Corresponding results will be compared to those provided by a standard calibration and also to computation of models, for passive and active devices. The efforts made during caracterization of elements allow thus a better understanding and design, thanks to a very precise modeling.