Reliability analysis of a two state repairable parallel redundant system under human failure |
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Authors: | PP Gupta Rakesh Kumar Sharma |
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Abstract: | In this paper, the investigations have been carried out for the MTTF and reliability analysis of a repairable two-unit redundant electronic equipment having two states under human failures. The two-unit repairable parallel redundant system suffers two types of failures; viz; unit failure and human failure. Human failure brings the system to a complete failure stage. There is only one server who is always available. Laplace transforms of the probabilities of the complex system being in up and down states have been derived and have been inverted to obtain time dependent probabilities. Two graphs have also been given in the end. |
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