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Amorphous-crystalline silicon junctions |
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| Authors: | Jayadevaiah TS Busmundrud Odd |
| Affiliation: | University of Wisconsin-Milwaukee, Laboratory for Surface Studies and College of Applied Science & Engineering, Milwaukee, USA; |
| Abstract: | High barriers are observed in amorphous-p-type-silicon junctions, resulting in good rectification. No significant barriers are detected in amorphous-n-type-Si junctions. A simple model is also presented to describe the junction. |
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