首页 | 本学科首页   官方微博 | 高级检索  
     

基于LabVIEW的光耦低频噪声成分估计研究
引用本文:周求湛,杨熙春,王墨林,卢昊.基于LabVIEW的光耦低频噪声成分估计研究[J].测试技术学报,2005,19(2):234-236.
作者姓名:周求湛  杨熙春  王墨林  卢昊
作者单位:吉林大学,通信学院,吉林,长春,130022;吉林大学,通信学院,吉林,长春,130022;吉林大学,通信学院,吉林,长春,130022;吉林大学,通信学院,吉林,长春,130022
基金项目:吉林省科委自然科学基金资助项目(20030313);吉林大学创新基金资助项目(2003CX038)
摘    要:半导体的噪声成分估计是利用噪声进行器件可靠性筛选的前提条件。为此,组建了一套基于虚拟仪器的半导体噪声测试系统,在应用该系统对大量的光电耦合器件(OCD)进行测试基础上,提出了采用LabVIEW对实测噪声功率谱进行噪声成分估计及参数拟合的新方法。该方法的特点是不需要被测器件低频噪声的先验知识,为改进OCD及其他半导体器件的生产工艺和提高器件的可靠性提供了指导性的数据。

关 键 词:半导体噪声  低频噪声  噪声成分估计  参数拟合  虚拟仪器
文章编号:1671-7449(2005)02-0234-03
收稿时间:2004-10-21
修稿时间:2004年10月21

Study of Estimation for the Components of Low-Frequency Noise of Optoelectronic Coupled Devices Based on LabVIEW
ZHOU Qiu-zhan,YANG Xi-chun,WANG Mo-lin,LU Hao.Study of Estimation for the Components of Low-Frequency Noise of Optoelectronic Coupled Devices Based on LabVIEW[J].Journal of Test and Measurement Techol,2005,19(2):234-236.
Authors:ZHOU Qiu-zhan  YANG Xi-chun  WANG Mo-lin  LU Hao
Abstract: The noise components estimation of semiconductors is the precondition of reliability screening of semiconductor devices using noise measurement. Therefore a noise-measurement system for semiconductors based on virtual instrument was established. On the base of measuring a great deal of optoelectronic coupled devices (OCDs), which is very useful in many areas, a novel method that can estimate the noise components by PSD of the noise and carry though noise parameters fitting using LabVIEW was proposed. It is the characteristic that we can use the measurement without prior knowledge low frequency noise about semiconductors, which provides the probability to improve production techniques and reliability of OCD and other semiconductor devices.
Keywords:semicondutor noise  low-frequency noise  component estimation  parameter fitting  virtual instrument
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号