| 基于自动测试系统的测试数据格式标准化研究 |
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| 引用本文： | 韩东,郭士瑞,高剑,李杰.基于自动测试系统的测试数据格式标准化研究[J].电子测量技术,2017,40(6):47-52. |
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| 作者姓名： | 韩东 郭士瑞 高剑 李杰 |
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| 作者单位： | 北京自动测试技术研究所集成电路测试技术北京市重点实验室北京100088,北京自动测试技术研究所集成电路测试技术北京市重点实验室北京100088,北京自动测试技术研究所集成电路测试技术北京市重点实验室北京100088,北京自动测试技术研究所集成电路测试技术北京市重点实验室北京100088 |
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| 基金项目： | 北京市自然科学基金委员会-北京市科学技术研究院联合资助项目(L150009) |
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| 摘 要： | 为克服因不同自动测试系统生成测试数据不统一,所造成测试效率低下和成本浪费的问题.根据ATE统一测试数据标准格式STDF文件的规范,分析其内部各个模块的处理方法,使用LabWindows/CVI软件环境,设计了一种转换程序,通过算法完成了二进制文件STDF与文本文件的双向转换,通过对比转换生成的文本和标准ATD文本,验证了程序转换结果的正确性,最后将转换程序植入国产自动测试系统BC3192V50,从而实现测试数据标准化.测试实验结果表明,该算法能够高效的实现双向转换,规范了测试数据的结构,提升了测试数据的可分析性.
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| 关 键 词： | 自动测试系统 二进制文件 测试数据标准化 |
Standardization research of STDF based on the automatic test equipment |
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| Han Dong,Guo Shirui,Gao Jian and Li Jie.Standardization research of STDF based on the automatic test equipment[J].Electronic Measurement Technology,2017,40(6):47-52. |
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| Authors: | Han Dong Guo Shirui Gao Jian and Li Jie |
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| Affiliation: | Beijing Key Laboratory of Integrated Circuit Testing Technology, Beijing Institute of Automatic Test Technology, Beijing 100088, China,Beijing Key Laboratory of Integrated Circuit Testing Technology, Beijing Institute of Automatic Test Technology, Beijing 100088, China,Beijing Key Laboratory of Integrated Circuit Testing Technology, Beijing Institute of Automatic Test Technology, Beijing 100088, China and Beijing Key Laboratory of Integrated Circuit Testing Technology, Beijing Institute of Automatic Test Technology, Beijing 100088, China |
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| Abstract: | Because of the test data is not unified, the test efficiency of the ATE is low and the cost is wasted. In order to overcome this problem, we analyzed the processing methods of each STDF file module and designed a conversion program using LabWindows/CVI software environment for Specification of STDF files, which is the test data standard format for ATE. By this algorithm, the bidirectional conversion between binary file STDF and text file is completed. By comparing the generated text and standard ATD text, the correctness of the program transformation is verified. In the end, the conversion program is embedded in the domestic BC3192V50 ATE, it realized the uniform of the test data. The result of the test shows that this algorithm can efficiently achieve bidirectional conversion, the structure of the test data is regulated and the analysis ability of the test data is improved. |
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| Keywords: | ATE binary file STDF |
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