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红外焦平面探测器的暗电流测试分析及性能研究
引用本文:王晓龙,李冬冰,张兴胜.红外焦平面探测器的暗电流测试分析及性能研究[J].红外,2019,40(11):23-28.
作者姓名:王晓龙  李冬冰  张兴胜
作者单位:中国电子科技集团第十一研究所,中国电子科技集团第十一研究所,中国电子科技集团第十一研究所
摘    要:针对碲镉汞红外焦平面探测器,研究了两种暗电流测试方法。降低暗电流直接关系到探测器的信噪比。对所研制的碲镉汞光伏探测器在工作条件下的暗电流大小进行了测试分析。通过对比多组测试结果发现,工作温度及工艺对暗电流具有不同程度的影响。该研究为以后改进工艺和提高探测器性能及筛选效率提供了理论依据。

关 键 词:红外探测器  焦平面阵列  暗电流  碲镉汞
收稿时间:2019/8/29 0:00:00
修稿时间:2019/9/29 0:00:00

Study on Dark Current Test and Device Performance of Infrared Focal Plane Detector
WANG Xiao-long,LI Dong-bing and ZHANG Xing-sheng.Study on Dark Current Test and Device Performance of Infrared Focal Plane Detector[J].Infrared,2019,40(11):23-28.
Authors:WANG Xiao-long  LI Dong-bing and ZHANG Xing-sheng
Affiliation:CETC,CETC,CETC
Abstract:Two dark-current test methods for or the mercury cadmium telluride(HgCdTe)infrared focal plane detector are studied. Reducing the dark current is directly related to the signal-to-noise ratio of the detector. The dark current of the developed HgCdTe photovoltaic detector under working conditions is tested and analyzed. By comparing multiple test results, it is found that the operating temperature and process have different degrees of influence on the dark current. This study provides a theoretical basis for improving the process, detector performance and screening efficiency in the future.
Keywords:infrared detector  focal plane array  dark current  HgCdTe
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