首页 | 本学科首页   官方微博 | 高级检索  
     


Directed assembly of nano-particles with the help of charge patterns created with scanning electron microscope
Authors:AC Zonnevylle  CW Hagen  P Kruit  A Schmidt-Ott
Affiliation:1. School of Mechanical and Aerospace Engineering, Seoul National University, Seoul 151-744, Republic of Korea;2. Global Frontier Center for Multiscale Energy System, Seoul National University, Seoul 151-744, Republic of Korea;1. Fusion Materials Research Unit, National Fusion Laboratory, CIEMAT, Av Complutense, 40, 28040 Madrid, Spain;2. Centre for Micro Analysis of Materials, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain;1. Faculty of Science, Urmia Branch, Islamic Azad University, Urmia, Iran;2. Young Researchers Club, Urmia Branch, Islamic Azad University, Urmia, Iran;1. Laboratoire d’Études et de Recherche sur les Matériaux, les Procédés et les Surfaces (LERMPS-UTBM), site de Montbéliard, 90010 Belfort Cedex, France;2. Institut Jean Lamour, UMR 7198 CNRS, Université de Lorraine, Parc Saurupt – CS 50840, 54011 Nancy, France;3. Institut FEMTO-ST, UMR 6174 CNRS, Université de Franche-Comté, ENSMM, UTBM, 32, Avenue de l’observatoire, 25044 Besançon Cedex, France
Abstract:Directed assembly of nano-particles by charged patterns on an insulator surface is a method that has been applied before, but the creation of the charged patterns was a time consuming process in previous work. Here a scanning electron microscope (SEM) is used to speed up the charging process. The main challenges do not lie in focusing the electron beam but in storing the charge in the insulator in a highly localized way. The present paper shows the first promising results of directing nano-particles to predefined charge patterns on insulators, where the charge is created with a finely focused electron beam. The nano-particles (palladium) are created in an Ar atmosphere with a glowing wire generator (GWG). A narrow size interval of charged particles is selected by a mobility analyzer. From gas suspension they are deposited onto the charge patterns.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号